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test-and-measurement:analog-discovery-pro-5250:start [2022/02/21 13:15] – cut samples spec from netowrk analyzer features Arthur Browntest-and-measurement:analog-discovery-pro-5250:start [2022/10/04 04:38] (current) – external edit 127.0.0.1
Line 40: Line 40:
 | Output Range =  ±12 V, maximum | Output Range =  ±12 V, maximum
 | DC Offset = ±12 V, maximum | DC Offset = ±12 V, maximum
 +
 +| Header = Data Logger
 +| Channels = 2 (Shared with Oscilloscope)
 +| Supported Measurements = DC, True RMS, AC RMS, Custom
  
 | Header = Programmable Power Supply | Header = Programmable Power Supply
Line 46: Line 50:
 | Header = Digital Multimeter | Header = Digital Multimeter
 | Measurements = DC Voltage, AC Voltage, AC Current, Resistance, Diode, Continuity | Measurements = DC Voltage, AC Voltage, AC Current, Resistance, Diode, Continuity
-| Digits = 5 1/2+| Digits = 5½
 | Sample Rate = 5 S/s | Sample Rate = 5 S/s
  
 | Header = Digital I/O | Header = Digital I/O
 | Channels = 8 | Channels = 8
-| Logic level = 5 V compatible TTL input / 3.3 V LVTTL output+| Logic Level = 5 V compatible TTL input / 3.3 V LVTTL output
  
 | Header = Logic Analyzer | Header = Logic Analyzer
Line 89: Line 93:
   * [[test-and-measurement:guides:waveforms-oscilloscope]]   * [[test-and-measurement:guides:waveforms-oscilloscope]]
   * [[test-and-measurement:guides:waveforms-waveform-generator]]   * [[test-and-measurement:guides:waveforms-waveform-generator]]
-  * [[test-and-measurement:guides:waveforms-supplies]]+  * [[test-and-measurement:guides:waveforms-readback-supplies]]
   * [[test-and-measurement:guides:waveforms-dmm]]   * [[test-and-measurement:guides:waveforms-dmm]]
 +  * [[test-and-measurement:guides:waveforms-data-logger]]
   * [[test-and-measurement:guides:waveforms-logic-analyzer]]   * [[test-and-measurement:guides:waveforms-logic-analyzer]]
   * [[test-and-measurement:guides:waveforms-static-io]]   * [[test-and-measurement:guides:waveforms-static-io]]
Line 104: Line 109:
   * [[test-and-measurement:guides:waveforms-cross-triggers]]   * [[test-and-measurement:guides:waveforms-cross-triggers]]
   * [[test-and-measurement:guides:waveforms-external-triggers]]   * [[test-and-measurement:guides:waveforms-external-triggers]]
-  * [[test-and-measurement:guides:waveforms-using-waveforms-sdk]]+  * [[test-and-measurement:guides:waveforms-sdk-getting-started]]
  
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Line 124: Line 129:
  
 ===== Additional Resources ===== ===== Additional Resources =====
-  * {{reference:test-and-measurement:analog-discovery-pro-5250:adp5250_statement_of_volatility.pdf|Statement of Volatility}}+  * [[certifications]] 
 +  * {{https://files.digilent.com/resources/test-and-measurement/analog-discovery-pro-5250/adp5250-statement-of-volatility.pdf|Statement of Volatility}} 
 + 
 +/*https://www.ni.com/en-us/support/documentation/dimensional-drawings/model.vb-8012.html 2D and 3D models of virtual bench 
 +https://www.ni.com/pdf/manuals/371528e.pdf calibration procedure 
 +https://www.ni.com/pdf/manuals/375043d.pdf only documentation mentioned the scope compensation tabs on the front panel*
  
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